超大型積體電路之測試與可測試設計

標題:	超大型積體電路之測試與可測試設計 VLSI Testing and Design for Testability
作者:	李崇仁交通大學電子工程系
關鍵字:	超大型積體電路;可測試性設計;靜態電流測試;振盪環測試;錯誤診斷;VLSI;IDDQ testing;Burn-in testing;Oscillation ring testing;Fault diagnosis
公開日期:	1999
官方說明文件#:	NSC88-2215-E009-062
URI:	http://hdl.handle.net/11536/94228 https://www.grb.gov.tw/search/planDetail?id=418219&docId=74193
Appears in Collections:	Research Plans

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