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國立陽明交通大學機構典藏
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公開日期
標題
作者
24-九月-2012
Abnormal interface state generation under positive bias stress in TiN/HfO2 p-channel metal-oxide-semiconductor field effect transistors
Lo, Wen-Hung
;
Chang, Ting-Chang
;
Tsai, Jyun-Yu
;
Dai, Chih-Hao
;
Chen, Ching-En
;
Ho, Szu-Han
;
Chen, Hua-Mao
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
8-七月-2013
Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistors
Tsai, Jyun-Yu
;
Chang, Ting-Chang
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Ho, Szu-Han
;
Chen, Hua-Mao
;
Tai, Ya-Hsiang
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
1-十二月-2014
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
Liu, Kuan-Ju
;
Chang, Ting-Chang
;
Yang, Ren-Ya
;
Chen, Ching-En
;
Ho, Szu-Han
;
Tsai, Jyun-Yu
;
Hsieh, Tien-Yu
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電機工程學系
;
Department of Electrical and Computer Engineering
28-九月-2013
Abnormal threshold voltage shift under hot carrier stress in Ti1-xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors
Tsai, Jyun-Yu
;
Chang, Ting-Chang
;
Lo, Wen-Hung
;
Ho, Szu-Han
;
Chen, Ching-En
;
Chen, Hua-Mao
;
Tseng, Tseung-Yuen
;
Tai, Ya-Hsiang
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
2016
Abnormal Transconductance Enhancement under Positive Bias Stress in Nanoscale n-Channel Fin Field-Effect-Transistors
Liu, Kuan-Ju
;
Chang, Ting-Chang
;
Lin, Chien-Yu
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Lu, Ying-Hsin
;
Liu, Hsi-Wen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
31-十二月-2017
Analysis of abnormal transconductance in body-tied partially-depleted silicon-on-insulator n-MOSFETs
Lin, Chien-Yu
;
Chang, Ting-Chang
;
Liu, Kuan-Ju
;
Chen, Li-Hui
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Liu, Hsi-Wen
;
Lu, Ying-Hsin
;
Liao, Jin-Chien
;
Ciou, Fong-Min
;
Lin, Yu-Shan
;
電機學院
;
College of Electrical and Computer Engineering
1-一月-1970
Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors
Ho, Szu-Han
;
Chang, Ting-Chang
;
Wu, Chi-Wei
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Luo, Hung-Ping
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
3-十二月-2012
Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistors
Ho, Szu-Han
;
Chang, Ting-Chang
;
Lu, Ying-shin
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Chen, Hua-Mao
;
Wu, Chi-Wei
;
Luo, Hung-Ping
;
Liu, Guan-Ru
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
1-六月-2017
Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETs
Lin, Chien-Yu
;
Chang, Ting-Chang
;
Liu, Kuan-Ju
;
Chen, Li-Hui
;
Tsai, Jyun-Yu
;
Chen, Ching-En
;
Lu, Ying-Hsin
;
Liu, Hsi-Wen
;
Liao, Jin-Chien
;
Chang, Kuan-Chang
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
四月-2016
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics
Chen, Ching-En
;
Chang, Ting-Chang
;
You, Bo
;
Tsai, Jyun-Yu
;
Lo, Wen-Hung
;
Ho, Szu-Han
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Liu, Xi-Wen
;
Hung, Yu-Ju
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Lu, Ching-Sen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2013
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks
Ho, Szu-Han
;
Chang, Ting-Chang
;
Wu, Chi-Wei
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Chen, Hua-Mao
;
Liu, Guan-Ru
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Chen, Daniel
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
9-四月-2012
Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress
Lo, Wen-Hung
;
Chang, Ting-Chang
;
Tsai, Jyun-Yu
;
Dai, Chih-Hao
;
Chen, Ching-En
;
Ho, Szu-Han
;
Chen, Hua-Mao
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
30-十二月-2011
Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks
Dai, Chih-Hao
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
;
Kuo, Yuan-Jui
;
Hung, Ya-Chi
;
Lo, Wen-Hung
;
Ho, Szu-Han
;
Chen, Ching-En
;
Shih, Jou-Miao
;
Chung, Wan-Lin
;
Chen, Hua-Mao
;
Dai, Bai-Shan
;
Tsai, Tsung-Ming
;
Xia, Guangrui
;
Cheng, Osbert
;
Huang, Cheng Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2016
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors
Lu, Ying-Hsin
;
Chang, Ting-Chang
;
Ho, Szu-Han
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Liu, Kuan-Ju
;
Liu, Xi-Wen
;
Lin, Chien-yu
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Yen, Wei-Ting
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
6-十月-2014
Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks
Tsai, Jyun-Yu
;
Chang, Ting-Chang
;
Chen, Ching-En
;
Ho, Szu-Han
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Liu, Xi-Wen
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Lu, Ching-Sen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2017
Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO2 Layer in p-MOSFETs
Lu, Ying-Hsin
;
Chang, Ting-Chang
;
Liao, Jih-Chien
;
Chen, Li-Hui
;
Lin, Yu-Shan
;
Chen, Ching-En
;
Liu, Kuan-Ju
;
Liu, Xi-Wen
;
Lin, Chien-Yu
;
Lien, Chen-Hsin
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Yen, Wei-Ting
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
7-十一月-2013
High-k shallow traps observed by charge pumping with varying discharging times
Ho, Szu-Han
;
Chang, Ting-Chang
;
Lu, Ying-Hsin
;
Wang, Bin-Wei
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Chen, Hua-Mao
;
Liu, Kuan-Ju
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Chen, Tsai-Fu
;
Cao, Xi-Xin
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
18-二月-2013
Hole injection-reduced hot carrier degradation in n-channel metal-oxide-semiconductor field-effect-transistors with high-k gate dielectric
Tsai, Jyun-Yu
;
Chang, Ting-Chang
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Ho, Szu-Han
;
Chen, Hua-Mao
;
Tai, Ya-Hsiang
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
4-七月-2011
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
Dai, Chih-Hao
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
;
Kuo, Yuan-Jui
;
Ho, Szu-Han
;
Hsieh, Tien-Yu
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Shih, Jou-Miao
;
Chung, Wan-Lin
;
Dai, Bai-Shan
;
Chen, Hua-Mao
;
Xia, Guangrui
;
Cheng, Osbert
;
Huang, Cheng Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2012
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
Dai, Chih-Hao
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
;
Kuo, Yuan-Jui
;
Ho, Szu-Han
;
Hsieh, Tien-Yu
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Shih, Jou-Miao
;
Chung, Wan-Lin
;
Dai, Bai-Shan
;
Chen, Hua-Mao
;
Xia, Guangrui
;
Cheng, Osbert
;
Huang, Cheng Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics