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公開日期標題作者
1-十一月-2019Abnormal C-V Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTsHuang, Shin-Ping; Chen, Po-Hsun; Tsao, Yu-Ching; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Shih, Yao-Kai; Chung, Yu-Hua; Chen, Wei-Han; Wang, Terry Tai-Jui; Zhang, Sheng-Dong; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
十月-2016Adjustable built-in resistor on oxygen-vacancy-rich electrode-capped resistance random access memoryPan, Chih-Hung; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Kuan-Chang; Chu, Tian-Jian; Chen, Po-Hsun; Chen, Min-Chen; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2013The Analysis of Nano-Patterned Sapphire Substrates-Induced Compressive Strain to Enhance Quantum-Confined Stark Effect of InGaN-Based Light-Emitting DiodesChen, Po-Hsun; Su, Vincent; You, Yao-Hong; Lee, Ming-Lun; Hsieh, Cheng-Ju; Kuan, Chieh-Hsiung; Chen, Hung-Ming; Yang, Han-Bo; Lin, Hung-Chou; Lin, Ray-Ming; Chu, Fu-Chuan; Su, Gu-Yi; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2018Analyzing Electric Field Effect by Applying an Ultra-Short Time Pulse Condition in Hafnium Oxide-Based RRAMWu, Cheng-Hsien; Lin, Shih-Kai; Pan, Chih-Hung; Chen, Po-Hsun; Lin, Wen-Yan; Chang, Ting-Chang; Tsai, Tsung-Ming; Xu, You-Lin; Shih, Chih-Cheng; Lin, Yu-Shuo; Chen, Wen-Chung; Wang, Ming-Hui; Zhang, Sheng-Dong; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
7-七月-2017Attaining resistive switching characteristics and selector properties by varying forming polarities in a single HfO2-based RRAM device with a vanadium electrodeLin, Chih-Yang; Chen, Po-Hsun; Chang, Ting-Chang; Chang, Kuan-Chang; Zhang, Sheng-Dong; Tsai, Tsung-Ming; Pan, Chih-Hung; Chen, Min-Chen; Su, Yu-Ting; Tseng, Yi-Ting; Chang, Yao-Feng; Chen, Ying-Chen; Huang, Hui-Chun; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2018The Demonstration of Increased Selectivity During Experimental Measurement in Filament-Type Vanadium Oxide-Based SelectorChen, Chun-Kuei; Lin, Chih-Yang; Chen, Po-Hsun; Chang, Ting-Chang; Shih, Chih-Cheng; Tseng, Yi-Ting; Zheng, Hao-Xuan; Chen, Ying-Chen; Chang, Yao-Feng; Lin, Chun-Chu; Huang, Hui-Chun; Huang, Wei-Chen; Wang, Hao; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2019A Dual-Gate InGaZnO4-Based Thin-Film Transistor for High-Sensitivity UV DetectionChen, Po-Hsun; Tsao, Yu-Ching; Chien, Yu-Chieh; Chiang, Hsiao-Cheng; Chen, Hua-Mao; Lu, Ying-Hsin; Shih, Chih-Cheng; Tai, Mao-Chou; Chen, Guan-Fu; Tsai, Yu-Lin; Huang, Hui-Chun; Tsai, Tsung-Ming; Chang, Ting-Chang; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
1-五月-2017Effect of charge quantity on conduction mechanism of high-and low-resistance states during forming process in a one-transistor-one-resistor resistance random access memoryWu, Cheng-Hsien; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Kuan-Chang; Chu, Tian-Jian; Pan, Chih-Hung; Su, Yu-Ting; Chen, Po-Hsun; Lin, Shih-Kai; Hu, Shih-Jie; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2020Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film TransistorsHuang, Shin-Ping; Chen, Hong-Chih; Chen, Po-Hsun; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Chen, Yu-An; Sun, Pei-Jun; Huang, Hui-Chun; Lai, Wei-Chih; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
三月-2016Effects of erbium doping of indium tin oxide electrode in resistive random access memoryChen, Po-Hsun; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Pan, Chih-Hung; Lin, Chih-Yang; Jin, Fu-Yuan; Chen, Min-Chen; Huang, Hui-Chun; Lo, Ikai; Zheng, Jin-Cheng; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
31-十月-2016Engineering interface-type resistance switching based on forming current compliance in ITO/Ga2O3: ITO/TiN resistance random access memory: Conduction mechanisms, temperature effects, and electrode influencePan, Chih-Hung; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Kuan-Chang; Chen, Po-Hsun; Chang-Chien, Shi-Wang; Chen, Min-Chen; Huang, Hui-Chun; Wu, Huaqiang; Deng, Ning; Qian, He; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2020Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTsZheng, Yu-Zhe; Huang, Shin-Ping; Chen, Po-Hsun; Chang, Ting-Chang; Tsai, Tsung-Ming; Chu, Ann-Kuo; Hung, Yang-Hao; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Tu, Yu-Fa; Chen, Yu-An; Sun, Pei-Jun; Chung, Yu-Hua; Chen, Wei-Han; Wang, Tai-Jui; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
9-十一月-2018Enhancement of Surface Chemical and Physical Properties of Germanium-Sulfur Thin Film Using a Water-Supplemented Carbon Dioxide Supercritical Fluid Treatment TechniqueYang, Chih-Cheng; Chen, Po-Hsun; Shih, Chih-Cheng; Wang, Ming-Hui; Tsai, Tsung-Ming; Zheng, Hao-Xuan; Chen, Wen-Chung; Chen, Min-Chen; Huang, Hui-Chun; Ma, Xiao-Hua; Hao, Yue; Huang, Jen-Wei; Sze, Simon M.; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2019Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film TransistorsHuang, Shin-Ping; Chen, Po-Hsun; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Tsao, Yu-Ching; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Lai, Wei-Chih; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
五月-2016Improving Performance by Doping Gadolinium Into the Indium-Tin-Oxide Electrode in HfO2-Based Resistive Random Access MemoryChen, Po-Hsun; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Pan, Chih-Hung; Lin, Chih-Yang; Jin, Fu-Yuan; Chen, Min-Chen; Huang, Hui-Chun; Wang, Ming-Hui; Lo, Ikai; Zheng, Jin-Cheng; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-1970Incorporation of Resistive Random Access Memory into Low-Temperature Polysilicon Transistor with Fin-Like Structure as 1T1R DeviceHuang, Wei-Chen; Zheng, Hao-Xuan; Chen, Po-Hsun; Chang, Ting-Chang; Tan, Yung-Fang; Lin, Shih-Kai; Zhang, Yong-Ci; Jin, Fu-Yuan; Wu, Chung-Wei; Yeh, Yu-Hsuan; Chou, Sheng-Yao; Huang, Hui-Chun; Chen, Yan-Wen; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2017Inert Pt electrode switching mechanism after controlled polarity-forming process in In2O3-based resistive random access memoryWu, Cheng-Hsien; Pan, Chih-Hung; Chen, Po-Hsun; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Kuan-Chang; Shih, Chih-Cheng; Chi, Ting-Yang; Chu, Tian-Jian; Wu, Jia-Ji; Du, Xiaoqin; Zheng, Hao-Xuan; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2019Investigating Material Changes at Different Gadolinium Doping Power Levels in Indium-Tin Oxide Intended for Use as an Insulator in Resistive Switching MemoryLin, Chun-Chu; Chen, Po-Hsun; Chen, Min-Chen; Chang, Ting-Chang; Lin, Chih-Yang; Zheng, Hao-Xuan; Chen, Chun-Kuei; Huang, Wei-Chen; Chen, Wen-Chung; Huang, Hui-Chun; Tsai, Tsung-Ming; Ma, Xiao-Hua; Hao, Yue; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
30-十月-2019Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist EnvironmentChen, Hong-Chih; Kuo, Chuan-Wei; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Po-Hsun; Chen, Guan-Fu; Huang, Shin-Ping; Chen, Jian-Jie; Zhou, Kuan-Ju; Shih, Chih-Cheng; Tsao, Yu-Ching; Huang, Hui-Chun; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
9-一月-2020Investigation of the forming process under UV illumination in HfO2-based resistance random access memory with a transparent electrodeHuang, Wei-Chen; Huang, Shin-Ping; Chen, Po-Hsun; Chen, Min-Chen; Chang, Ting-Chang; Shih, Chih-Cheng; Tseng, Yi-Ting; Zheng, Hao-Xuan; Tan, Yung-Fang; Wu, Chung-Wei; Yeh, Yuh-Suan; Ma, Xiao-Hua; Hao, Yue; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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