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公開日期標題作者
1-二月-2003Ambipolar Schottky barrier silicon-on-insulator metal-oxide-semiconductor transistorsLin, HC; Wang, MF; Lu, CY; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2002Ambipolar Schottky-barrier TFTsLin, HC; Yeh, KL; Huang, TY; Huang, RG; Sze, SM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2003Analysis of narrow width effects in polycrystalline silicon thin film transistorsZan, HW; Chang, TC; Shih, PS; Peng, DZ; Huang, TY; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2000An anomalous crossover in Vth roll-off for indium-doped nMOSFETsChang, SJ; Chang, CY; Chen, CM; Chou, JW; Chao, TS; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2002Application of field-induced source/drain Schottky metal-oxide-semiconductor to fin-like body field-effect transistorLin, HC; Wang, MF; Hou, FJ; Liu, JT; Huang, TY; Sze, SM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Assessment of driver's driving performance and alertness using EEG-based fuzzy neural networksLin, CT; Chen, YC; Wu, RC; Liang, SF; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Automated information. mining on multimedia TV news archivesLai, PS; Cheng, SS; Sun, SY; Huang, TY; Su, JM; Xu, YY; Chen, YH; Chuang, SC; Tseng, CL; Hsieh, CL; Lu, YL; Shen, YC; Chen, JR; Niel, JB; Tsai, FP; Huang, HC; Pao, HT; Fu, HC; 資訊工程學系; 電子工程學系及電子研究所; 管理科學系; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics; Department of Management Science
1999Breakdown characteristics of ultra-thin gate oxides caused by plasma chargingChen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2002Breakdown modes and their evolution in ultrathin gate oxideLin, HC; Lee, DY; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drainLin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2005Channel backscattering characteristics of uniaxially strained nanoscale CMOSFETsLin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
18-十月-2004The characteristics of hole trapping in HfO2/SiO2 gate dielectrics with TiN gate electrodeLu, WT; Lin, PC; Huang, TY; Chien, CH; Yang, MJ; Huang, IJ; Lehnen, P; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2002Characteristics of polycrystalline silicon thin-film transistors with electrical source/drain extensions induced by a bottom sub-gateYu, M; Lin, HC; Chen, GH; Huang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2003Characteristics of Schottky barrier poly-Si thin film transistors with excimer laser annealing treatmentYeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1999Characterization and lithographic parameters extraction for the modified resistsKo, FH; Lu, JK; Chu, TC; Huang, TY; Yang, CC; Sheu, JT; Huang, HL; 奈米中心; Nano Facility Center
2000Characterization and modeling of out-diffusion of cesium, manganese and zinc impurities from deep ultraviolet photoresistKo, FH; Wang, MY; Wang, TK; Yang, CC; Huang, TY; Wu, CS; 奈米中心; Nano Facility Center
1-九月-1999Characterization and modeling of out-diffusion of manganese and zinc impurities from deep ultraviolet photoresistWang, MY; Ko, FH; Wang, TK; Yang, CC; Huang, TY; 奈米中心; Nano Facility Center
1-十月-2000Characterization and reliability of lightly-doped-drain polysilicon thin-film transistors with oxide sidewall spacer formed by one-step selective liquid phase depositionShih, PS; Chang, TC; Huang, TY; Yeh, CF; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-八月-1996Characterization of antenna effect by nondestructive gate current measurementLin, HC; Chien, CH; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-八月-1996Characterization of antenna effect by nondestructive gate current measurementLin, HC; Chien, CH; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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