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國立陽明交通大學機構典藏
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公開日期
標題
作者
1-二月-2003
Ambipolar Schottky barrier silicon-on-insulator metal-oxide-semiconductor transistors
Lin, HC
;
Wang, MF
;
Lu, CY
;
Huang, TY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2006
Characterization of programmed charge lateral distribution in a two-bit storage nitride flash memory cell by using a charge-pumping technique
Gu, SH
;
Wang, TH
;
Lu, WP
;
Ting, WC
;
Ku, YHJ
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2006
Device characteristics and aggravated negative bias temperature instability in p-channel metal-oxide-semiconductor field-effect transistors with uniaxial compressive strain
Lu, CY
;
Lin, HC
;
Chang, YF
;
Huang, TY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-五月-2004
An endurance evaluation method for flash EEPROM
Zous, NK
;
Chen, YJ
;
Chin, CY
;
Tsai, WJ
;
Lu, TC
;
Chen, MS
;
Lu, WP
;
Wang, TH
;
Pan, SC
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2004
Fabrication and characteristics of high-speed oxide-confined VCSELs using InGaAsP-InGaP strain-compensated MQWs
Chang, YH
;
Kuo, HC
;
Lai, FI
;
Chang, YA
;
Lu, CY
;
Laih, LH
;
Wang, SC
;
光電工程學系
;
Department of Photonics
1-二月-2003
High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctions
Lin, HC
;
Wang, MF
;
Hou, FJ
;
Lin, HN
;
Lu, CY
;
Liu, JT
;
Huang, TY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-七月-2004
High-speed (> 10 Gbps) 850 nm oxide-confined vertical cavity surface emitting lasers (VCSELs) with a planar process and reduced parasitic capacitance
Chang, YH
;
Lai, FI
;
Lu, CY
;
Kuo, HC
;
Yu, HC
;
Sung, CP
;
Yang, HP
;
Wang, SC
;
光電工程學系
;
Department of Photonics
1998
Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT's
Yeh, CF
;
Chen, DC
;
Lu, CY
;
Liu, C
;
Lee, ST
;
Liu, CH
;
Chen, TJ
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十月-2002
Highly reliable liquid-phase-deposited SiO2 with nitrous oxide plasma post-treatment for low-temperature-processed polysilicon thin film transistors
Yeh, CF
;
Chen, DCH
;
Lu, CY
;
Liu, C
;
Lee, ST
;
Liu, CH
;
Chen, TJ
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2006
Impacts of uniaxial compressive strain on dynamic negative bias temperature instability of p-channel MOSFETs
Lu, CY
;
Lin, HC
;
Huang, TY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2005
Improving high-temperature performance in continuous-wave mode InGaAsN/GaAsN ridge waveguide lasers
Chang, YA
;
Kuo, HC
;
Lu, CY
;
Kuo, YK
;
Wang, SC
;
光電工程學系
;
Department of Photonics
2004
Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique
Gu, SH
;
Wang, MT
;
Chan, CT
;
Zous, NK
;
Yeh, CC
;
Tsai, WJ
;
Lu, TC
;
Wang, TH
;
Ku, J
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-九月-2004
Lateral migration of trapped holes in a nitride storage flash memory cell and its qualification methodology
Zous, NK
;
Lee, MY
;
Tsai, WJ
;
Kuo, A
;
Huang, LT
;
Lu, TC
;
Liu, CJ
;
Wang, TH
;
Lu, WP
;
Ting, WC
;
Ku, J
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2003
A low noise composite-channel metamorphic HEMT for wireless communication applications
Lu, CY
;
Chen, KS
;
Lee, HM
;
Chang, EY
;
Chen, SH
;
Lin, YC
;
Chen, GJ
;
材料科學與工程學系
;
Department of Materials Science and Engineering
1-六月-2005
Mechanism for slow switching effect in advanced low-voltage, high-speed Pb(Zr1-XTiX)O-3 ferroelectric memory
Tsai, CW
;
Lai, SC
;
Yen, CT
;
Lien, HM
;
Lung, HL
;
Wu, TB
;
Wang, TH
;
Liu, R
;
Lu, CY
;
材料科學與工程學系
;
電子工程學系及電子研究所
;
Department of Materials Science and Engineering
;
Department of Electronics Engineering and Institute of Electronics
1-九月-2004
A novel erase scheme to suppress overerasure in a scaled 2-bit nitride storage flash memory cell
Yeh, CC
;
Wang, TH
;
Tsai, WJ
;
Lu, TC
;
Liao, YY
;
Chen, HY
;
Zous, NK
;
Ting, WC
;
Ku, J
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-三月-2005
A novel fully CMOS process compatible PREM for SOC applications
Yeh, CC
;
Wang, TH
;
Tsai, WJ
;
Lu, TC
;
Liao, YY
;
Zous, NK
;
Chin, CY
;
Chen, YR
;
Chen, MS
;
Ting, WC
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2006
A novel operation method to avoid overerasure in a scaled trapping-nitride localized charge storage flash memory cell and its application for multilevel programming
Tsai, WJ
;
Zous, NK
;
Wang, TH
;
Ku, YHJ
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2005
A novel PHINES flash memory cell with low power program/erase, small pitch, two-bits-per-cell for data storage applications
Yeh, CC
;
Wang, TH
;
Tsai, WJ
;
Lu, TC
;
Chen, MS
;
Liao, YY
;
Ting, WC
;
Ku, YHJ
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2003
A novel soft-program for a narrow erased state Vt distribution, read disturbance suppression and over-program annihilation in multilevel cell flash memories
Yeh, CC
;
Fan, TH
;
Lu, TC
;
Wang, TH
;
Pan, S
;
Lu, CY
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics