Skip navigation
瀏覽
學術出版
教師專書
期刊論文
會議論文
研究計畫
畢業論文
專利資料
技術報告
數位教材
開放式課程
專題作品
喀報
交大建築展
明竹
活動紀錄
圖書館週
研究攻略營
畢業典禮
開學典禮
數位典藏
楊英風數位美術館
詩人管管數位典藏
歷史新聞
交大 e-News
交大友聲雜誌
陽明交大電子報
陽明交大英文電子報
陽明電子報
校內出版品
交大出版社
交大法學評論
管理與系統
新客家人群像
全球客家研究
犢:傳播與科技
資訊社會研究
交大資訊人
交大管理學報
數理人文
交大學刊
交通大學學報
交大青年
交大體育學刊
陽明神農坡彙訊
校務大數據研究中心電子報
人間思想
文化研究
萌牙會訊
Inter-Asia Cultural Studies
醫學院年報
醫學院季刊
陽明交大藥學系刊
永續發展成果年報
Open House
畢業紀念冊
畢業紀念冊
項目
公開日期
作者
標題
關鍵字
研究人員
English
繁體
简体
目前位置:
國立陽明交通大學機構典藏
瀏覽 的方式: 作者 Lu, Chih-Yuan
跳到:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
或是輸入前幾個字:
排序方式:
標題
公開日期
上傳日期
排序方式:
升冪排序
降冪排序
結果/頁面
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
作者/紀錄:
全部
1
5
10
15
20
25
30
35
40
45
50
顯示 1 到 20 筆資料,總共 49 筆
下一頁 >
公開日期
標題
作者
2007
A 2-bit/cell, maskless, self-aligned resistance memory with high thermal stability
He, ChiaHua
;
Lee, Ming-Daou
;
Pan, Chen-Ling
;
Lai, Erb-Kun
;
Yao, Yeong-Der
;
Hsieh, Kuang-Yeu
;
Liu, Rich
;
Lu, Chih-Yuan
;
材料科學與工程學系
;
Department of Materials Science and Engineering
1-一月-2018
Analysis and Realization of TLC or even QLC Operation with a High Performance Multi-times Verify Scheme in 3D NAND Flash memory
Lu, C. C.
;
Cheng, C. C.
;
Chiu, H. P.
;
Lin, W. L.
;
Chen, T. W.
;
Ku, S. H.
;
Tsai, Wen-Jer
;
Lu, T. C.
;
Chen, K. C.
;
Wang, Tahui
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2006
<bold>Read Current Instability Arising from Random Telegraph Noise in Localized Storage, Multi-Level SONOS Flash Memory</bold>
Gu, S. H.
;
Li, C. W.
;
Wang, Tahui
;
Lu, W. P.
;
Chen, K. C.
;
Ku, Joseph
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2007
Characterization and Monte Carlo analysis of secondary electrons induced program disturb in a buried diffusion bit-line SONOS flash memory
Tang, Chun-Jung
;
Li, C. W.
;
Wang, Tahui
;
Gu, S. H.
;
Chen, P. C.
;
Chang, Y. W.
;
Lu, T. C.
;
Lu, W. P.
;
Chen, K. C.
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
17-七月-2017
Characterization of nitride hole lateral transport in a charge trap flash memory by using a random telegraph signal method
Liu, Yu-Heng
;
Jiang, Cheng-Min
;
Lin, Hsiao-Yi
;
Wang, Tahui
;
Tsai, Wen-Jer
;
Lu, Tao-Cheng
;
Chen, Kuang-Chao
;
Lu, Chih-Yuan
;
電機學院
;
電子工程學系及電子研究所
;
College of Electrical and Computer Engineering
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2018
Chip-Level Characterization and RTN-Induced Error Mitigation beyond 20nm Floating Gate Flash Memory
Lin, T. W.
;
Ku, S. H.
;
Cheng, C. H.
;
Lee, C. W.
;
Ijen-Huang
;
Tsai, Wen-Jer
;
Lu, T. C.
;
Lu, W. P.
;
Chen, K. C.
;
Wang, Tahui
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2017
A Comprehensive Study of 3-stage High Resistance State Retention Behavior for TMO ReRAMs from Single Cells to a Large Array
Lin, Yu-Hsuan
;
Ho, Yung-Han
;
Lee, Ming-Hsiu
;
Wang, Chao-Hung
;
Lin, Yu-Yu
;
Lee, Feng-Ming
;
Hsu, Kai-Chieh
;
Tseng, Po-Hao
;
Lee, Dai-Ying
;
Chiang, Kuang-Hao
;
Wang, Keh-Chung
;
Tseng, Tseung-Yuen
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-二月-2015
Cycling-Induced SET-Disturb Failure Time Degradation in a Resistive Switching Memory
Chung, Yueh-Ting
;
Su, Po-Cheng
;
Cheng, Yu-Hsuan
;
Wang, Tahui
;
Chen, Min-Cheng
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
一月-2017
Electric Field Induced Nitride Trapped Charge Lateral Migration in a SONOS Flash Memory
Liu, Yu-Heng
;
Jiang, Cheng-Min
;
Chen, Wei-Chun
;
Wang, Tahui
;
Tsai, Wen-Jer
;
Lu, Tao-Cheng
;
Chen, Kuang-Chao
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
一月-2017
Electric Field Induced Nitride Trapped Charge Lateral Migration in a SONOS Flash Memory
Liu, Yu-Heng
;
Jiang, Cheng-Min
;
Chen, Wei-Chun
;
Wang, Tahui
;
Tsai, Wen-Jer
;
Lu, Tao-Cheng
;
Chen, Kuang-Chao
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2018
Error Characterization and ECC Usage Relaxation beyond 20nm Floating Gate NAND Flash Memory
Ku, S. H.
;
Lin, T. W.
;
Cheng, C. H.
;
Lee, C. W.
;
Chen, Ti-Wen
;
Tsai, Wen-Jer
;
Lu, T. C.
;
Lu, W. P.
;
Chen, K. C.
;
Wang, Tahui
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2018
Excellent High Temperature Retention of TiOXNV ReRAM by Interfacial Layer Engineering
Lin, Yu-Hsuan
;
Lee, Dai-Ying
;
Wang, Chao-Hung
;
Lee, Ming-Hsiu
;
Ho, Yung-Han
;
Lai, Erh-Kun
;
Chiang, Kuang-Hao
;
Lung, Hsiang-Lan
;
Wang, Keh-Chung
;
Tseng, Tseung-Yuen
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2016
Excellent Resistance Variability Control of WOx ReRAM by a Smart Writing Algorithm
Lin, Yu-Hsuan
;
Wu, Jau-Yi
;
Lee, Ming-Hsiu
;
Wang, Tien-Yen
;
Lin, Yu-Yu
;
Lee, Feng-Ming
;
Lee, Dai-Ying
;
Lai, Erh-Kun
;
Chiang, Kuang-Hao
;
Lung, Hsiang-Lan
;
Hsieh, Kuang-Yeu
;
Tseng, Tseung-Yuen
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
16-十月-2006
Extraction of nitride trap density from stress induced leakage current in silicon-oxide-nitride-oxide-silicon flash memory
Gu, Shaw-Hung
;
Wang, Tahui
;
Lu, Wen-Pin
;
Ku, Yen-Hui Joseph
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2019
Grain Boundary Trap-Induced Current Transient in a 3-D NAND Flash Cell String
Lin, Wei-Liang
;
Tsai, Wen-Jer
;
Cheng, C. C.
;
Ku, S. H.
;
Liu, Lenvis
;
Hwang, S. W.
;
Lu, Tao-Cheng
;
Chen, Kuang-Chao
;
Tseng, Tseung-Yuen
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2008
Highly reliable MA BE-SONOS (Metal-Al2O3 bandgap engineered SONOS) using a SiO2 buffer layer
Lai, Sheng-Chih
;
Lue, Hang-Ting
;
Liao, Chien-Wei
;
Wu, Tai-Bor
;
Yang, Ming-Jui
;
Lue, Yi-Hsien
;
Hsieh, Jung-Yu
;
Wang, Szu-Yu
;
Luo, Guang-Li
;
Chien, Chao-Hsin
;
Hsieh, Kuang-Yeu
;
Liu, Rich
;
Lu, Chih-Yuan
;
物理研究所
;
奈米中心
;
Institute of Physics
;
Nano Facility Center
1-一月-2019
Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory
Lin, Wei-Liang
;
Tsai, Wen-Jer
;
Cheng, C. C.
;
Lu, Chun-Chang
;
Ku, S. H.
;
Chang, Y. W.
;
Wu, Guan-Wei
;
Liu, Lenvis
;
Hwang, S. W.
;
Lu, Tao-Cheng
;
Chen, Kuang-Chao
;
Tseng, Tseung-Yuen
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2015
Impact of V-pass Interference on Charge-Trapping NAND Flash Memory Devices
Hsiao, Yi-Hsuan
;
Lue, Hang-Ting
;
Chen, Wei-Chen
;
Chang, Kuo-Pin
;
Tsui, Bing-Yue
;
Hsieh, Kuang-Yeu
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2006
Investigation of charge loss in cycled NBit cells via field and temperature accelerations
Tsai, W. J.
;
Zous, N. K.
;
Chen, H. Y.
;
Liu, Lenvis
;
Yeh, C. C.
;
Chen, Sam
;
Lu, W. P.
;
Wang, Tahui
;
Ku, Joseph
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2018
Investigation of Data Pattern Effects on Nitride Charge Lateral Migration in a Charge Trap Flash Memory by Using a Random Telegraph Signal Method
Liu, Y. H.
;
Lin, H. Y.
;
Jiang, C. M.
;
Wang, Tahui
;
Tsai, W. J.
;
Lu, T. C.
;
Chen, K. C.
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics