1. 目前位置：

瀏覽 的方式： 作者 Lu, Ching-Sen

跳到： 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
或是輸入前幾個字：  
顯示 1 到 13 筆資料，總共 13 筆
公開日期標題作者
四月-2016Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate DielectricsChen, Ching-En; Chang, Ting-Chang; You, Bo; Tsai, Jyun-Yu; Lo, Wen-Hung; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Hung, Yu-Ju; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
6-十月-2014Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacksTsai, Jyun-Yu; Chang, Ting-Chang; Chen, Ching-En; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2015The Impact of Pre/Post-metal Deposition Annealing on Negative-Bias-Temperature Instability in HfO2 Stack p-Channel Metal-Oxide-Semiconductor Field Effect TransistorsLu, Ying-Hsin; Chang, Ting-Chang; Ho, Szu-Han; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Liu, Xi-Wen; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
19-三月-2007Impacts of a polycrystalline-silicon buffer layer on the performance and reliability of strained n-channel metal-oxide-semiconductor field-effect transistors with SiN cappingLu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2007Impacts of low-pressure chemical vapor deposition-SiN capping layer and lateral distribution of interface traps on hot-carrier stress of n-channel metal-oxide-semiconductor field-effect-transistorsLu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lu, Chia-Yu; Lee, Yao-Jen; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Impacts of precursor flow rate and temperature of PECVD-SiN capping films on strained-channel NMOSFETsLu, Ching-Sen; Lin, Horng-Chih; Lee, Yao-Jen; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2008Impacts of SiN deposition parameters on n-channel metal-oxide-semiconductor field-effect-transistorsLu, Ching-Sen; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layerLu, Ching-Sen; Lin, Horng-Chih; Lee, Yao-Jen; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Improved NBTI in SiN-capped PMOSFETs with ultra-thin HfO2 bufferLu, Ching-Sen; Lin, Horng-Chih; Chen, Ying-Hung; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Improvement of negative-bias-temperature instability in SiN-capped p-channel metal-oxide-semiconductor field-effect transistors using ultrathin HfO2 buffer layerLu, Ching-Sen; Horng-Chih, Lin; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
17-三月-2014Investigation of abnormal negative threshold voltage shift under positive bias stress in input/output n-channel metal-oxide-semiconductor field-effect transistors with TiN/HfO2 structure using fast I-V measurementHo, Szu-Han; Chang, Ting-Chang; Lu, Ying-Hsin; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Optimization of SiN film by varying precursor flow conditions and its impacts on strained channel NMOSFETsLu, Ching-Sen; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008具有氮化矽覆蓋之形變通道金氧半場效電晶體特性與相關可靠性問題研究盧景森; Lu, Ching-Sen; 林鴻志; 黃調元; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子研究所
顯示 1 到 13 筆資料，總共 13 筆