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國立陽明交通大學機構典藏
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公開日期
標題
作者
1-四月-2012
Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors
Chang, Geng-Wei
;
Chang, Ting-Chang
;
Jhu, Jhe-Ciou
;
Tsai, Tsung-Ming
;
Syu, Yong-En
;
Chang, Kuan-Chang
;
Tai, Ya-Hsiang
;
Jian, Fu-Yen
;
Hung, Ya-Chi
;
光電工程學系
;
Department of Photonics
1-三月-2012
Asymmetric Carrier Conduction Mechanism by Tip Electric Field in WSiOX Resistance Switching Device
Syu, Yong-En
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Geng-Wei
;
Chang, Kuan-Chang
;
Lou, Jyun-Hao
;
Tai, Ya-Hsiang
;
Tsai, Ming-Jinn
;
Wang, Ying-Lang
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
29-四月-2013
Atomic-level quantized reaction of HfOx memristor
Syu, Yong-En
;
Chang, Ting-Chang
;
Lou, Jyun-Hao
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Tsai, Ming-Jinn
;
Wang, Ying-Lang
;
Liu, Ming
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2012
Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Syu, Yong-En
;
Chuang, Siang-Lan
;
Chang, Geng-Wei
;
Liu, Guan-Ru
;
Chen, Min-Chen
;
Huang, Hui-Chun
;
Liu, Shih-Kun
;
Tai, Ya-Hsiang
;
Gan, Der-Shin
;
Yang, Ya-Liang
;
Young, Tai-Fa
;
Tseng, Bae-Heng
;
Chen, Kai-Huang
;
Tsai, Ming-Jinn
;
Ye, Cong
;
Wang, Hao
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
1-三月-2013
Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
Chang, Ting-Chang
;
Wu, Hsing-Hua
;
Chen, Jung-Hui
;
Syu, Yong-En
;
Chang, Geng-Wei
;
Chu, Tian-Jian
;
Liu, Guan-Ru
;
Su, Yu-Ting
;
Chen, Min-Chen
;
Pan, Jhih-Hong
;
Chen, Jian-Yu
;
Tung, Cheng-Wei
;
Huang, Hui-Chun
;
Tai, Ya-Hsiang
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
14-十月-2013
Characteristics of hafnium oxide resistance random access memory with different setting compliance current
Su, Yu-Ting
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Zhang, Rui
;
Lou, J. C.
;
Chen, Jung-Hui
;
Young, Tai-Fa
;
Chen, Kai-Huang
;
Tseng, Bae-Heng
;
Shih, Chih-Cheng
;
Yang, Ya-Liang
;
Chen, Min-Chen
;
Chu, Tian-Jian
;
Pan, Chih-Hung
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2014
Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory
Zhang, Rui
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Huang, Syuan-Yong
;
Chen, Wen-Jen
;
Chen, Kai-Huang
;
Lou, Jen-Chung
;
Chen, Jung-Hui
;
Young, Tai-Fa
;
Chen, Min-Chen
;
Chen, Hsin-Lu
;
Liang, Shu-Ping
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2013
Charge Quantity Influence on Resistance Switching Characteristic During Forming Process
Chu, Tian-Jian
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Wu, Hsing-Hua
;
Chen, Jung-Hui
;
Chang, Kuan-Chang
;
Young, Tai-Fa
;
Chen, Kai-Hsang
;
Syu, Yong-En
;
Chang, Geng-Wei
;
Chang, Yao-Feng
;
Chen, Min-Chen
;
Lou, Jyun-Hao
;
Pan, Jhih-Hong
;
Chen, Jian-Yu
;
Tai, Ya-Hsiang
;
Ye, Cong
;
Wang, Hao
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
10-九月-2012
Dehydroxyl effect of Sn-doped silicon oxide resistance random access memory with supercritical CO2 fluid treatment
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Syu, Yong-En
;
Liao, Kuo-Hsiao
;
Tseng, Bae-Heng
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
腦科學研究中心
;
Department of Electronics Engineering and Institute of Electronics
;
Brain Research Center
三月-2016
Effect of different constant compliance current for hopping conduction distance properties of the Sn:SiOx thin film RRAM devices
Chen, Kai-Huang
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Liao, Kuo-Hsiao
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2013
Effect of Electrode Material on Resistive Switching Characteristics in TaON Nonvolatile Memory Devices
Chen, Min-Chen
;
Chang, Ting-Chang
;
Chiu, Yi-Chieh
;
Chen, Shih-Cheng
;
Huang, Sheng-Yao
;
Syu, Yong-En
;
Chang, Kuan-Chang
;
Huang, Hui-Chun
;
Tsai, Tsung-Ming
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
20-五月-2013
The effect of high/low permittivity in bilayer HfO2/BN resistance random access memory
Huang, Jen-Wei
;
Zhang, Rui
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Lou, J. C.
;
Young, Tai-Fa
;
Chen, Jung-Hui
;
Chen, Hsin-Lu
;
Pan, Yin-Chih
;
Huang, Xuan
;
Zhang, Fengyan
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2012
The Effect of Silicon Oxide Based RRAM with Tin Doping
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
Chang, Ting-Chang
;
Syu, Yong-En
;
Chuang, Siang-Lan
;
Li, Cheng-Hua
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2012
The Effect of Silicon Oxide Based RRAM with Tin Doping (vol 15, pg H65, 2012)
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
Chang, Ting-Chang
;
Syu, Yong-En
;
Liao, Kuo-Hsiao
;
Chuang, Siang-Lan
;
Li, Cheng-Hua
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2015
Effects of Varied Negative Stop Voltages on Current Self-Compliance in Indium Tin Oxide Resistance Random Access Memory
Lin, Chih-Yang
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Pan, Chih-Hung
;
Zhang, Rui
;
Liu, Kuan-Hsien
;
Chen, Hua-Mao
;
Tseng, Yi-Ting
;
Hung, Ya-Chi
;
Syu, Yong-En
;
Zheng, Jin-Cheng
;
Wang, Ying-Lang
;
Zhang, Wei
;
Sze, Simon M.
;
電子物理學系
;
光電工程學系
;
Department of Electrophysics
;
Department of Photonics
19-八月-2013
Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
Zhang, Rui
;
Chang, Ting-Chang
;
Chen, Kai-Huang
;
Chen, Jung-Hui
;
Young, Tai-Fa
;
Lou, J. C.
;
Chu, Tian-Jian
;
Shih, Chih-Cheng
;
Pan, Jhih-Hong
;
Su, Yu-Ting
;
Syu, Yong-En
;
Tung, Cheng-Wei
;
Chen, Min-Chen
;
Wu, Jia-Jie
;
Hu, Ying
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-七月-2013
Endurance Improvement Technology With Nitrogen Implanted in the Interface of WSiOx Resistance Switching Device
Syu, Yong-En
;
Zhang, Rui
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Lou, Jen-Chung
;
Young, Tai-Fa
;
Chen, Jung-Hui
;
Chen, Min-Chen
;
Yang, Ya-Liang
;
Shih, Chih-Cheng
;
Chu, Tian-Jian
;
Chen, Jian-Yu
;
Pan, Chih-Hung
;
Su, Yu-Ting
;
Huang, Hui-Chun
;
Gan, Der-Shin
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
21-十一月-2013
High performance of graphene oxide-doped silicon oxide-based resistance random access memory
Zhang, Rui
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chen, Kai-Huang
;
Lou, Jen-Chung
;
Chen, Jung-Hui
;
Young, Tai-Fa
;
Shih, Chih-Cheng
;
Yang, Ya-Liang
;
Pan, Yin-Chih
;
Chu, Tian-Jian
;
Huang, Syuan-Yong
;
Pan, Chih-Hung
;
Su, Yu-Ting
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-四月-2013
Hopping conduction distance dependent activation energy characteristics of Zn:SiO2 resistance random access memory devices
Chen, Kai-Huang
;
Zhang, Rui
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Chang, Kuan-Chang
;
Lou, J. C.
;
Young, Tai-Fa
;
Chen, Jung-Hui
;
Shih, Chih-Cheng
;
Tung, Cheng-Wei
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2015
Hopping conduction properties of the Sn:SiO (X) thin-film resistance random access memory devices induced by rapid temperature annealing procedure
Chen, Kai-Huang
;
Chang, Kuan-Chang
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
;
Liao, Kuo-Hsiao
;
Syu, Yong-En
;
Sze, Simon M.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics