標題: | Numerical study of super-resolved optical microscopy with partly staggered beams |
作者: | He, Jinping Wang, Nan Kobayashi, Takayoshi 電機學院 College of Electrical and Computer Engineering |
關鍵字: | microscopy;super-resolution;partly staggered beams;vector diffraction theory |
公開日期: | Dec-2016 |
摘要: | The resolving power of optical microscopy involving two or even more beams, such as pump-probe microscopy and nonlinear optical microscopy, can be enhanced both laterally and longitudinally with partly staggered beams. A numerical study of the new super-resolution imaging technology is performed with vector diffraction theory. The influence of polarization is discussed. A resolving power of sub-100 nm and sub-300 nm in the lateral and longitudinal directions, respectively, is achievable. |
URI: | http://dx.doi.org/10.1088/2040-8978/18/12/125303 http://hdl.handle.net/11536/132777 |
ISSN: | 2040-8978 |
DOI: | 10.1088/2040-8978/18/12/125303 |
期刊: | Journal of Optics |
Volume: | 18 |
Issue: | 12 |
Appears in Collections: | Articles |