標題: Numerical study of super-resolved optical microscopy with partly staggered beams
作者: He, Jinping
Wang, Nan
Kobayashi, Takayoshi
電機學院
College of Electrical and Computer Engineering
關鍵字: microscopy;super-resolution;partly staggered beams;vector diffraction theory
公開日期: 十二月-2016
摘要: The resolving power of optical microscopy involving two or even more beams, such as pump-probe microscopy and nonlinear optical microscopy, can be enhanced both laterally and longitudinally with partly staggered beams. A numerical study of the new super-resolution imaging technology is performed with vector diffraction theory. The influence of polarization is discussed. A resolving power of sub-100 nm and sub-300 nm in the lateral and longitudinal directions, respectively, is achievable.
URI: http://dx.doi.org/10.1088/2040-8978/18/12/125303
http://hdl.handle.net/11536/132777
ISSN: 2040-8978
DOI: 10.1088/2040-8978/18/12/125303
期刊: Journal of Optics
Volume: 18
Issue: 12
顯示於類別:期刊論文