標題: Compensation Circuit with Additional Junction Sensor to Enhance Latchup Immunity for CMOS Integrated Circuits
作者: Tsai, Hui-Wen
Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Latchup;electrostatic discharge (ESD) protection;guard ring
公開日期: 2015
摘要: A circuit solution to generate compensation current that can decrease the perturbation induced by the external latchup trigger was proposed. The robustness against latchup can be improved by supporting compensation current at the pad under latch-up current test. By inserting additional junctions to sense the latchup trigger current, the injected latchup trigger current can be detected, and then the I/O or ESD-protection devices are used to generate the compensation current that decrease the perturbation to the internal circuits. The proposed design has been successfully verified in a 0.5-mu m BCD process to improve latchup immunity.
URI: http://hdl.handle.net/11536/135943
ISBN: 978-1-4799-9877-7
期刊: 2015 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN (ECCTD)
起始頁: 256
結束頁: 259
Appears in Collections:Conferences Paper