標題: | A fast and sensitive built-in current sensor for IDDQ testing |
作者: | Lu, CW Lee, CL Chen, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1996 |
URI: | http://hdl.handle.net/11536/19867 |
ISBN: | 0-8186-7655-8 |
期刊: | 1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS |
起始頁: | 56 |
結束頁: | 58 |
顯示於類別: | 會議論文 |