標題: A fast and sensitive built-in current sensor for IDDQ testing
作者: Lu, CW
Lee, CL
Chen, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1996
URI: http://hdl.handle.net/11536/19867
ISBN: 0-8186-7655-8
期刊: 1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS
起始頁: 56
結束頁: 58
Appears in Collections:Conferences Paper