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國立陽明交通大學機構典藏
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公開日期
標題
作者
1-一月-2018
Error Characterization and ECC Usage Relaxation beyond 20nm Floating Gate NAND Flash Memory
Ku, S. H.
;
Lin, T. W.
;
Cheng, C. H.
;
Lee, C. W.
;
Chen, Ti-Wen
;
Tsai, Wen-Jer
;
Lu, T. C.
;
Lu, W. P.
;
Chen, K. C.
;
Wang, Tahui
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2013
Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging Electrode
Chen, Min-Cheng
;
Chen, Hsiao-Chien
;
Lee, Ta-Hsien
;
Lin, Yu-Hsien
;
Shih, Jyun-Hung
;
Wang, Bo-Wei
;
Hou, Yun-Fang
;
Chen, Yi-Ju
;
Lin, Chia-Yi
;
Lin, Chang-Hsien
;
Hsieh, Yi-Ping
;
Ho, ChiaHua
;
Hua, Mu-Yi
;
Qiu, Jian-Tai
;
Wang, Tahui
;
Yang, Fu-Liang
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
16-十月-2006
Extraction of nitride trap density from stress induced leakage current in silicon-oxide-nitride-oxide-silicon flash memory
Gu, Shaw-Hung
;
Wang, Tahui
;
Lu, Wen-Pin
;
Ku, Yen-Hui Joseph
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2014
Hybrid Si/TMD 2D Electronic Double Channels Fabricated Using Solid CVD Few-Layer-MoS2 Stacking for V-th Matching and CMOS-Compatible 3DFETs
Chen, Min-Cheng
;
Lin, Chia-Yi
;
Li, Kai-Hsin
;
Li, Lain-Jong
;
Chen, Chang-Hsiao
;
Chuang, Cheng-Hao
;
Lee, Ming-Dao
;
Chen, Yi-Ju
;
Hou, Yun-Fang
;
Lin, Chang-Hsien
;
Chen, Chun-Chi
;
Wu, Bo-Wei
;
Wu, Cheng-San
;
Yang, Ivy
;
Lee, Yao-Jen
;
Yeh, Wen-Kuan
;
Wang, Tahui
;
Yang, Fu-Liang
;
Hu, Chenming
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2007
Impact of self-heating effect on hot carrier degradation in high-voltage LDMOS
Cheng, Chih-Chang
;
Lin, J. F.
;
Wang, Tahui
;
Hsieh, T. H.
;
Tzeng, J. T.
;
Jong, Y. C.
;
Liou, R. S.
;
Pan, Samuel C.
;
Hsu, S. L.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2006
Insight of stress effect on the ONO stack layer in a SONOS-type flash memory cell
Yeh, C. C.
;
Liao, Y. Y.
;
Wang, Tahui
;
Tsai, W. J.
;
Lu, T. C.
;
Kao, H. L.
;
Ou, T. F.
;
Chen, M. S.
;
Chen, Y. K.
;
Lai, E. K.
;
Shih, Y. H.
;
Ting, WenChi
;
Ku, Y. H. Joseph
;
Lit, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2006
Investigation of charge loss in cycled NBit cells via field and temperature accelerations
Tsai, W. J.
;
Zous, N. K.
;
Chen, H. Y.
;
Liu, Lenvis
;
Yeh, C. C.
;
Chen, Sam
;
Lu, W. P.
;
Wang, Tahui
;
Ku, Joseph
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2018
Investigation of Data Pattern Effects on Nitride Charge Lateral Migration in a Charge Trap Flash Memory by Using a Random Telegraph Signal Method
Liu, Y. H.
;
Lin, H. Y.
;
Jiang, C. M.
;
Wang, Tahui
;
Tsai, W. J.
;
Lu, T. C.
;
Chen, K. C.
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2019
Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on ${V}_{{t}}$ Retention Loss in a Multilevel Charge Trap Flash Memory
Liu, Yu-Heng
;
Zhan, Ting-Chien
;
Wang, Tahui
;
Tsai, Wen-Jer
;
Lu, Tao-Cheng
;
Chen, Kuang-Chao
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2016
Investigation of Factors Affecting SET-Disturb Failure Time in a Resistive Switching Memory
Su, P. C.
;
Chung, Y. T.
;
Chen, M. C.
;
Wang, Tahui
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2006
Investigation of hot carrier degradation modes in LDMOS by using a novel three-region charge pumping technique
Cheng, C. C.
;
Tu, K. C.
;
Wang, Tahui
;
Hsieh, T. H.
;
Tzeng, J. T.
;
Jong, Y. C.
;
Liou, R. S.
;
Pan, Sam C.
;
Hsu, S. L.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2009
Investigation of Post-NBT Stress Current Instability Modes in HfSiON Gate Dielectric pMOSFETs by Measurement of Individual Trapped Charge Emissions
Ma, H. C.
;
Chiu, J. P.
;
Tang, C. J.
;
Wang, Tahui
;
Chang, C. S.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2014
Investigation of Random Telegraph Noise Amplitudes in Hafnium Oxide Resistive Memory Devices
Chung, Y. T.
;
Liu, Y. H.
;
Su, P. C.
;
Cheng, Y. H.
;
Wang, Tahui
;
Chen, M. C.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2007
Investigation of the strained PMOS on (110) substrate
Tang, Chun-Jung
;
Huang, Shih-Hian
;
Wang, Tahui
;
Chang, Chih-Sheng
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十一月-2018
Modeling of Read-Disturb-Induced SET-State Current Degradation in a Tungsten Oxide Resistive Switching Memory
Su, Po-Cheng
;
Jiang, Cheng-Min
;
Wang, Chih-Wei
;
Wang, Tahui
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-二月-2009
A Novel Hot-Electron Programming Method in a Buried Diffusion Bit-Line SONOS Memory by Utilizing Nonequilibrium Charge Transport
Wang, Tahui
;
Tang, Chun-Jung
;
Li, C. -W.
;
Lee, Chih Hsiung
;
Ou, T. -F
;
Chang, Yao-Wen
;
Tsai, Wen-Jer
;
Lu, Tao-Cheng
;
Chen, K. -C.
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-三月-2011
A Novel Random Telegraph Signal Method to Study Program/Erase Charge Lateral Spread and Retention Loss in a SONOS Flash Memory
Ma, Huan-Chi
;
Chou, You-Liang
;
Chiu, Jung-Piao
;
Chung, Yueh-Ting
;
Lin, Tung-Yang
;
Wang, Tahui
;
Chao, Yuan-Peng
;
Chen, Kuang-Chao
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2007
Numerical simulation of bottom oxide thickness effect on charge retention in SONOS flash memory cells
Gu, Shaw-Hung
;
Hsu, Chih-Wei
;
Wang, Tahui
;
Lu, Wen-Pin
;
Ku, Yen-Hui Joseph
;
Lu, Chih-Yuan
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2016
A Numerical Study of Si-TMD Contact with n/p Type Operation and Interface Barrier Reduction for Sub-5 nm Monolayer MoS2 FET
Tang, Ying-Tsan
;
Li, Kai-Shin
;
Li, Lain-Jong
;
Li, Ming-Yang
;
Lin, Chang-Hsien
;
Chen, Yi-Ju
;
Chen, Chun-Chi
;
Su, Chuan-Jung
;
Wu, Bo-Wei
;
Wu, Cheng-San
;
Chen, Min-Cheng
;
Shieh, Jia-Min
;
Yeh, Wen-Kuan
;
Su, Po-Cheng
;
Wang, Tahui
;
Yang, Fu-Liang
;
Hu, Chenming
;
電機工程學系
;
Department of Electrical and Computer Engineering
2009
Overall Operation Considerations for a SONOS-based Memory
Lee, C. H.
;
Tu, W. H.
;
Chong, L. H.
;
Gu, S. H.
;
Chen, K. F.
;
Chen, Y. J.
;
Hsieh, J. Y.
;
Huang, I. J.
;
Zous, N. K.
;
Han, T. T.
;
Chen, M. S.
;
Lu, W. P.
;
Chen, K. C.
;
Wang, Tahui
;
Lu, C. Y.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics