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公開日期標題作者
1-一月-20123D Ferroelectric-like NVM/CMOS Hybrid Chip by sub-400 degrees C Sequential Layered IntegrationLien, Yu-Chung; Shieh, Jia-Min; Huang, Wen-Hsien; Hsieh, Wei-Shang; Tu, Cheng-Hui; Wang, Chieh; Shen, Chang-Hong; Chou, Tung-Huan; Chen, Min-Cheng; Huang, Jung Y.; Pan, Ci-Ling; Lai, Yin-Chieh; Hu, Chenming; Yang, Fu-Liang; 光電工程學系; Department of Photonics
十二月-2016Activating basal-plane catalytic activity of two-dimensional MoS2 monolayer with remote hydrogen plasmaCheng, Chia-Chin; Lu, Ang-Yu; Tseng, Chien-Chih; Yang, Xiulin; Hedhili, Mohamed Nejib; Chen, Min-Cheng; Wei, Kung-Hwa; Li, Lain-Jong; 材料科學與工程學系; Department of Materials Science and Engineering
1-四月-2012A CMOS-Compatible Poly-Si Nanowire Device with Hybrid Sensor/Memory Characteristics for System-on-Chip ApplicationsChen, Min-Cheng; Chen, Hao-Yu; Lin, Chia-Yi; Chien, Chao-Hsin; Hsieh, Tsung-Fan; Horng, Jim-Tong; Qiu, Jian-Tai; Huang, Chien-Chao; Ho, Chia-Hua; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2012A Comparative Study of NBTI and RTN Amplitude Distributions in High-kappa Gate Dielectric pMOSFETsChiu, J. P.; Chung, Y. T.; Wang, Tahui; Chen, Min-Cheng; Lu, C. Y.; Yu, K. F.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2015Cycling-Induced SET-Disturb Failure Time Degradation in a Resistive Switching MemoryChung, Yueh-Ting; Su, Po-Cheng; Cheng, Yu-Hsuan; Wang, Tahui; Chen, Min-Cheng; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging ElectrodeChen, Min-Cheng; Chen, Hsiao-Chien; Lee, Ta-Hsien; Lin, Yu-Hsien; Shih, Jyun-Hung; Wang, Bo-Wei; Hou, Yun-Fang; Chen, Yi-Ju; Lin, Chia-Yi; Lin, Chang-Hsien; Hsieh, Yi-Ping; Ho, ChiaHua; Hua, Mu-Yi; Qiu, Jian-Tai; Wang, Tahui; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2011Fabrication of High-Sensitivity Polycrystalline Silicon Nanowire Field-Effect Transistor pH Sensor Using Conventional Complementary Metal-Oxide-Semiconductor TechnologyChen, Hou-Yu; Lin, Chia-Yi; Chen, Min-Cheng; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2018Fabrication of High-Sensitivity Polycrystalline Silicon Nanowire Field-Effect Transistor pH Sensor Using Conventional Complementary Metal-Oxide-Semiconductor Technology (vol 50, 04DL05, 2011)Chen, Hou-Yu; Lin, Chia-Yi; Chen, Min-Cheng; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015High Performance Poly Si Junctionless Transistors with Sub-5nm Conformally Doped Layers by Molecular Monolayer Doping and Microwave Incorporating CO2 Laser Annealing for 3D Stacked ICs ApplicationsLee, Yao-Jen; Cho, Ta-Chun; Sung, Po-Jung; Kao, Kuo-Hsing; Hsueh, Fu-Kuo; Hou, Fu-Ju; Chen, Po-Cheng; Chen, Hsiu-Chih; Wu, Chien-Ting; Hsu, Shu-Han; Chen, Yi-Ju; Huang, Yao-Ming; Hou, Yun-Fang; Huang, Wen-Hsien; Yang, Chih-Chao; Chen, Bo-Yuan; Lin, Kun-Lin; Chen, Min-Cheng; Shen, Chang-Hong; Huang, Guo-Wei; Huang, Kun-Ping; Current, Michael I.; Li, Yiming; Samukawa, Seiji; Wu, Wen-Fa; Shieh, Jia-Min; Chao, Tien-Sheng; Yeh, Wen-Kuan; 電子物理學系; 電機學院; Department of Electrophysics; College of Electrical and Computer Engineering
2014Hybrid Si/TMD 2D Electronic Double Channels Fabricated Using Solid CVD Few-Layer-MoS2 Stacking for V-th Matching and CMOS-Compatible 3DFETsChen, Min-Cheng; Lin, Chia-Yi; Li, Kai-Hsin; Li, Lain-Jong; Chen, Chang-Hsiao; Chuang, Cheng-Hao; Lee, Ming-Dao; Chen, Yi-Ju; Hou, Yun-Fang; Lin, Chang-Hsien; Chen, Chun-Chi; Wu, Bo-Wei; Wu, Cheng-San; Yang, Ivy; Lee, Yao-Jen; Yeh, Wen-Kuan; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2017Investigation of strain-induced phase transformation in ferroelectric transistor using metal-nitride gate electrodeChiu, Yu-Chien; Cheng, Chun-Hu; Chang, Chun-Yen; Tang, Ying-Tsan; Chen, Min-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2016MOS2 U-shape MOSFET with 10 nm Channel Length and Poly-Si Source/Drain Serving as Seed for Full Wafer CVD MOS2 AvailabilityLi, Kai-Shin; Wu, Bo-Wei; Li, Lain-Jong; Li, Ming-Yang; Cheng, Chia-Chin Kevin; Hsu, Cho-Lun; Lin, Chang-Hsien; Chen, Yi-Ju; Chen, Chun-Chi; Wu, Chien-Ting; Chen, Min-Cheng; Shieh, Jia-Min; Yeh, Wen-Kuan; Chueh, Yu-Lun; Yang, Fu-Liang; Hu, Chenming; 材料科學與工程學系; Department of Materials Science and Engineering
2011Nickel Silicide Formation using Pulsed Laser Annealing for nMOSFET Performance ImprovementChen, Hou-Yu; Lin, Chia-Yi; Chen, Min-Cheng; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2016A Numerical Study of Si-TMD Contact with n/p Type Operation and Interface Barrier Reduction for Sub-5 nm Monolayer MoS2 FETTang, Ying-Tsan; Li, Kai-Shin; Li, Lain-Jong; Li, Ming-Yang; Lin, Chang-Hsien; Chen, Yi-Ju; Chen, Chun-Chi; Su, Chuan-Jung; Wu, Bo-Wei; Wu, Cheng-San; Chen, Min-Cheng; Shieh, Jia-Min; Yeh, Wen-Kuan; Su, Po-Cheng; Wang, Tahui; Yang, Fu-Liang; Hu, Chenming; 電機工程學系; Department of Electrical and Computer Engineering
2016One-Transistor Ferroelectric Versatile Memory: Strained-Gate Engineering for Realizing Energy-Efficient Switching and Fast Negative-Capacitance OperationChiu, Yu-Chien; Cheng, Chun-Hu; Chang, Chun-Yen; Tang, Ying-Tsan; Chen, Min-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2012Random Telegraph Noise in 1X-nm CMOS Silicide Contacts and a Method to Extract Trap DensityChen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Ho, Chia-Hua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2017RF power FinFET transistors with a wide drain-extended finChen, Bo-Yuan; Chen, Kun-Ming; Chiu, Chia-Sung; Huang, Guo-Wei; Chen, Hsiu-Chih; Chen, Chun-Chi; Hsueh, Fu-Kuo; Chen, Min-Cheng; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
六月-2016SET/RESET Cycling-Induced Trap Creation and SET-Disturb Failure Time Degradation in a Resistive-Switching MemoryChung, Yueh-Ting; Su, Po-Cheng; Lin, Wen-Jie; Chen, Min-Cheng; Wang, Tahui; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011Silicide Barrier Engineering Induced Random Telegraph Noise in 1Xnm CMOS ContactsChen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Huang, Chien-Chao; Ho, ChiaHua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2013Statistical Characterization and Modeling of the Temporal Evolutions of Delta V-t Distribution in NBTI Recovery in Nanometer MOSFETsChiu, Jung-Piao; Liu, Yu-Heng; Hsieh, Hung-Da; Li, Chi-Wei; Chen, Min-Cheng; Wang, Tahui; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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