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公開日期標題作者
1-十二月-2010Characteristics of the Fluorinated High-k Inter-Poly DielectricsHsieh, Chih-Ren; Chen, Yung-Yu; Lu, Kwung-Wen; Lin, Gray; Lou, Jen-Chung; 電機工程學系; Department of Electrical and Computer Engineering
1-六月-2014Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access MemoryZhang, Rui; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Huang, Syuan-Yong; Chen, Wen-Jen; Chen, Kai-Huang; Lou, Jen-Chung; Chen, Jung-Hui; Young, Tai-Fa; Chen, Min-Chen; Chen, Hsin-Lu; Liang, Shu-Ping; Syu, Yong-En; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2010Effect of fluorinated silicate glass passivation layer on electrical characteristics and dielectric reliabilities for the HfO(2)/SiON gate stacked nMOSFETHsieh, Chih-Ren; Chen, Yung-Yu; Lou, Jen-Chung; 電機工程學系; Department of Electrical and Computer Engineering
1-十一月-2010Effect of fluorinated silicate glass passivation layer on electrical characteristics and dielectric reliabilities for the HfO2/SiON gate stacked nMOSFETHsieh, Chih-Ren; Chen, Yung-Yu; Lou, Jen-Chung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2011Effect of interfacial fluorination on the electrical properties of the inter-poly high-k dielectricsHsieh, Chih-Ren; Chen, Yung-Yu; Lu, Kwung-Wen; Lin, Gray; Lou, Jen-Chung; 電機工程學系; Department of Electrical and Computer Engineering
2007Effect of UV illumination on inverted-staggered a-Si : H thin film transistorsLi, Yiming; Lou, Jen-Chung; Chen, Chung-Le; Hwang, Chih-Hong; Yan, Shuoting; 電信工程研究所; Institute of Communications Engineering
31-十二月-2017Endurance improvement and resistance stabilization of transparent multilayer resistance switching devices with oxygen deficient WOx layer and heat dissipating AlN buffer layerLin, Yu-Hsuan; Huang, Ding-Chiuan; Lou, Jen-Chung; Tseng, Tseung-Yuen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2013Endurance Improvement Technology With Nitrogen Implanted in the Interface of WSiOx Resistance Switching DeviceSyu, Yong-En; Zhang, Rui; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Kuan-Chang; Lou, Jen-Chung; Young, Tai-Fa; Chen, Jung-Hui; Chen, Min-Chen; Yang, Ya-Liang; Shih, Chih-Cheng; Chu, Tian-Jian; Chen, Jian-Yu; Pan, Chih-Hung; Su, Yu-Ting; Huang, Hui-Chun; Gan, Der-Shin; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011Enhanced data retention characteristic on SOHOS-type nonvolatile flash memory with CF4-plasma-induced deep electron trap levelHsieh, Chih-Ren; Chen, Yung-Yu; Lin, Wen-Shin; Lin, Gray; Lou, Jen-Chung; 電機工程學系; Department of Electrical and Computer Engineering
2005Fabrication of pattern-depended metal induced lateral crystallization polysilicon thin film transistors with NH3 plasma passivation effectsChou, Cheng-Wei; Wu, Yung-Chun; Wu, Yuan-Chun; Chang, Ting-Chang; Liu, Po-Tsun; Lou, Jen-Chung; Huang, Wen-Jun; Chang, Chun-Yen; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009HfO2 Inter-Poly Dielectric Characteristics with Interface Fluorine PassivationChen, Yung-Yu; Hsieh, Chih-Ren; Lu, Kwung-Wen; Lou, Jen-Chung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
21-十一月-2013High performance of graphene oxide-doped silicon oxide-based resistance random access memoryZhang, Rui; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Chen, Kai-Huang; Lou, Jen-Chung; Chen, Jung-Hui; Young, Tai-Fa; Shih, Chih-Cheng; Yang, Ya-Liang; Pan, Yin-Chih; Chu, Tian-Jian; Huang, Syuan-Yong; Pan, Chih-Hung; Su, Yu-Ting; Syu, Yong-En; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2013Hopping Effect of Hydrogen-Doped Silicon Oxide Insert RRAM by Supercritical CO2 Fluid TreatmentChang, Kuan-Chang; Pan, Chih-Hung; Chang, Ting-Chang; Tsai, Tsung-Ming; Zhang, Rui; Lou, Jen-Chung; Young, Tai-Fa; Chen, Jung-Hui; Shih, Chih-Cheng; Chu, Tian-Jian; Chen, Jian-Yu; Su, Yu-Ting; Jiang, Jhao-Ping; Chen, Kai-Huang; Huang, Hui-Chun; Syu, Yong-En; Gan, Der-Shin; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008Impact of Charge Trapping Effect on Negative Bias Temperature Instability in P-MOSFETs with HfO(2)/SiON Gate StackChen, Shih-Chang; Chien, Chao-Hsin; Lou, Jen-Chung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
11-一月-2010Improved performance and reliability for metal-oxide-semiconductor field-effect-transistor with fluorinated silicate glass passivation layerHsieh, Chih-Ren; Chen, Yung-Yu; Lou, Jen-Chung; 電機工程學系; Department of Electrical and Computer Engineering
1-九月-2007Improvements of ozone surface treatment on the electrical characteristics and reliability in HfO2 gate stacksChen, Shih-Chang; Chen, Yung-Yu; Chang, Yu-Tzu; Lou, Jen-Chung; Kin, Kon-Tsu; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
21-十二月-2013Mechanism of power consumption inhibitive multi-layer Zn:SiO2/SiO2 structure resistance random access memoryZhang, Rui; Tsai, Tsung-Ming; Chang, Ting-Chang; Chang, Kuan-Chang; Chen, Kai-Huang; Lou, Jen-Chung; Young, Tai-Fa; Chen, Jung-Hui; Huang, Syuan-Yong; Chen, Min-Chen; Shih, Chih-Cheng; Chen, Hsin-Lu; Pan, Jhih-Hong; Tung, Cheng-Wei; Syu, Yong-En; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2015Nitrogen Buffering Effect on Oxygen in Indium-Tin-Oxide-Capped Resistive Random Access Memory With NH3 TreatmentChen, Ji; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Pan, Chih-Hung; Zhang, Rui; Lou, Jen-Chung; Chu, Tian-Jian; Wu, Cheng-Hsien; Chen, Min-Chen; Hung, Ya-Chi; Syu, Yong-En; Zheng, Jin-Cheng; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
20-八月-2007Nonvolatile memory characteristics of nickel-silicon-nitride nanocrystalChen, Wei-Ren; Chang, Ting-Chang; Liu, Po-Tsun; Yeh, Jui-Lung; Tu, Chun-Hao; Lou, Jen-Chung; Yeh, Ching-Fa; Chang, Chun-Yen; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-一月-2009Reliability Improvement of HfO(2)/SiON Gate Stacked nMOSFET using Fluorinated Silicate Glass Passivation LayerHsieh, Chih-Ren; Chen, Yung-Yu; Chung, Jer-Fu; Lou, Jen-Chung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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