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國立陽明交通大學機構典藏
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顯示 1 到 18 筆資料,總共 18 筆
公開日期
標題
作者
2016
Abnormal Transconductance Enhancement under Positive Bias Stress in Nanoscale n-Channel Fin Field-Effect-Transistors
Liu, Kuan-Ju
;
Chang, Ting-Chang
;
Lin, Chien-Yu
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Lu, Ying-Hsin
;
Liu, Hsi-Wen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
31-十二月-2017
Analysis of abnormal transconductance in body-tied partially-depleted silicon-on-insulator n-MOSFETs
Lin, Chien-Yu
;
Chang, Ting-Chang
;
Liu, Kuan-Ju
;
Chen, Li-Hui
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Liu, Hsi-Wen
;
Lu, Ying-Hsin
;
Liao, Jin-Chien
;
Ciou, Fong-Min
;
Lin, Yu-Shan
;
電機學院
;
College of Electrical and Computer Engineering
1-六月-2017
Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETs
Lin, Chien-Yu
;
Chang, Ting-Chang
;
Liu, Kuan-Ju
;
Chen, Li-Hui
;
Tsai, Jyun-Yu
;
Chen, Ching-En
;
Lu, Ying-Hsin
;
Liu, Hsi-Wen
;
Liao, Jin-Chien
;
Chang, Kuan-Chang
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
四月-2016
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics
Chen, Ching-En
;
Chang, Ting-Chang
;
You, Bo
;
Tsai, Jyun-Yu
;
Lo, Wen-Hung
;
Ho, Szu-Han
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Liu, Xi-Wen
;
Hung, Yu-Ju
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Lu, Ching-Sen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-二月-2018
Combined Effects of Light Illumination and Various Bottom Gate Length on the Instability of Via-Contact-Type Amorphous InGaZnO Thin-Film Transistors
Yang, Chung-I
;
Chang, Ting-Chang
;
Liao, Po-Yung
;
Chen, Bo-Wei
;
Chou, Wu-Ching
;
Chen, Guan-Fu
;
Huang, Shin-Ping
;
Zheng, Yu-Zhe
;
Wang, Yu-Xuan
;
Liu, Hsi-Wen
;
Lin, Chien-Yu
;
Lin, Yu-Shan
;
Lu, Ying-Hsin
;
Zhang, Shengdong
;
電子物理學系
;
Department of Electrophysics
1-八月-2019
A Dual-Gate InGaZnO4-Based Thin-Film Transistor for High-Sensitivity UV Detection
Chen, Po-Hsun
;
Tsao, Yu-Ching
;
Chien, Yu-Chieh
;
Chiang, Hsiao-Cheng
;
Chen, Hua-Mao
;
Lu, Ying-Hsin
;
Shih, Chih-Cheng
;
Tai, Mao-Chou
;
Chen, Guan-Fu
;
Tsai, Yu-Lin
;
Huang, Hui-Chun
;
Tsai, Tsung-Ming
;
Chang, Ting-Chang
;
光電工程學系
;
光電工程研究所
;
Department of Photonics
;
Institute of EO Enginerring
1-十二月-2016
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors
Lu, Ying-Hsin
;
Chang, Ting-Chang
;
Ho, Szu-Han
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Liu, Kuan-Ju
;
Liu, Xi-Wen
;
Lin, Chien-yu
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Yen, Wei-Ting
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
6-十月-2014
Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks
Tsai, Jyun-Yu
;
Chang, Ting-Chang
;
Chen, Ching-En
;
Ho, Szu-Han
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Liu, Xi-Wen
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Lu, Ching-Sen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2017
Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO2 Layer in p-MOSFETs
Lu, Ying-Hsin
;
Chang, Ting-Chang
;
Liao, Jih-Chien
;
Chen, Li-Hui
;
Lin, Yu-Shan
;
Chen, Ching-En
;
Liu, Kuan-Ju
;
Liu, Xi-Wen
;
Lin, Chien-Yu
;
Lien, Chen-Hsin
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Yen, Wei-Ting
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
7-十一月-2013
High-k shallow traps observed by charge pumping with varying discharging times
Ho, Szu-Han
;
Chang, Ting-Chang
;
Lu, Ying-Hsin
;
Wang, Bin-Wei
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Chen, Hua-Mao
;
Liu, Kuan-Ju
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Chen, Tsai-Fu
;
Cao, Xi-Xin
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
1-十二月-2016
Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs
Lin, Chien-Yu
;
Chang, Ting-Chang
;
Liu, Kuan-Ju
;
Tsai, Jyun-Yu
;
Chen, Ching-En
;
Liu, Hsi-Wen
;
Lu, Ying-Hsin
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2015
The Impact of Pre/Post-metal Deposition Annealing on Negative-Bias-Temperature Instability in HfO2 Stack p-Channel Metal-Oxide-Semiconductor Field Effect Transistors
Lu, Ying-Hsin
;
Chang, Ting-Chang
;
Ho, Szu-Han
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Liu, Kuan-Ju
;
Liu, Xi-Wen
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Lu, Ching-Sen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
17-三月-2014
Investigation of abnormal negative threshold voltage shift under positive bias stress in input/output n-channel metal-oxide-semiconductor field-effect transistors with TiN/HfO2 structure using fast I-V measurement
Ho, Szu-Han
;
Chang, Ting-Chang
;
Lu, Ying-Hsin
;
Chen, Ching-En
;
Tsai, Jyun-Yu
;
Liu, Kuan-Ju
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Lu, Ching-Sen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2016
Investigation of Abnormal Off-Current in p-Channel Double Diffused Drain Metal-Oxide-Semiconductor Transistors after Hot Carrier Stress
Chen, Ching-En
;
Chang, Ting-Chang
;
Lu, Ying-Hsin
;
Chen, Hua-Mao
;
Chen, Bo-Wei
;
Pan, Chih-Hung
;
Hung, Yu-Ju
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
24-八月-2015
Investigation of defect-induced abnormal body current in fin field-effect-transistors
Liu, Kuan-Ju
;
Chang, Ting-Chang
;
Chen, Ching-En
;
Yang, Ren-Ya
;
Tsai, Jyun-Yu
;
Lu, Ying-Hsin
;
Liu, Xi-Wen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-一月-2015
A Method to Determine the Located Region of Lateral Trap Position by Analysis of Three-Level Random Telegraph Signals in n-MOSFETs
Chen, Ching-En
;
Chang, Ting-Chang
;
You, Bo
;
Tsai, Jyun-Yu
;
Lo, Wen-Hung
;
Ho, Szu-Han
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Hung, Yu-Ju
;
Tseng, Tseung-Yuen
;
Wu, James
;
Tsai, Wei-Kung
;
Chenge, Kuo-Yu
;
Syu, Yong-En
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-六月-2014
On the Origin of Anomalous OffCurrent Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure
Chen, Ching-En
;
Chang, Ting-Chang
;
Chen, Hua-Mao
;
You, Bo
;
Yang, Kai-Hsiang
;
Ho, Szu-Han
;
Tsai, Jyun-Yu
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Hung, Yu-Ju
;
Tai, Ya-Hsiang
;
Tseng, Tseung-Yuen
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
25-四月-2016
Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate
Liu, Hsi-Wen
;
Chang, Ting-Chang
;
Tsai, Jyun-Yu
;
Chen, Ching-En
;
Liu, Kuan-Ju
;
Lu, Ying-Hsin
;
Lin, Chien-Yu
;
Tseng, Tseung-Yuen
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
Ye, Yi-Han
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics