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公開日期標題作者
1-十一月-1998Application of plasma immersion ion implantation doping to low-temperature processed poly-Si TFT'sYeh, CF; Chen, TJ; Liu, C; Shao, JQ; Cheung, NW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-1999Application of selective liquid-phase deposition to fabricate contact holes without plasma damageYeh, CF; Liu, CH; Su, JL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1998Applying selective liquid-phase deposition to create contact holes in plasma damage-free processYeh, CF; Liu, CH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996Approach to room temperature process - A novel thin liquid-phase deposited oxideYeh, CF; Lin, SS; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-九月-1999Characteristics of novel polysilicon oxide by anodic oxidationYeh, CF; Liu, JS; Chiang, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2000Characterization and reliability of lightly-doped-drain polysilicon thin-film transistors with oxide sidewall spacer formed by one-step selective liquid phase depositionShih, PS; Chang, TC; Huang, TY; Yeh, CF; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-1995Chemical mechanical polishing of PSG and BPSG dielectric films: The effect of phosphorus and boron concentrationLiu, CW; Dai, BT; Yeh, CF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2000Comprehensive investigation on fluorosilicate glass prepared by temperature-difference-based liquid-phase depositionYeh, CF; Lee, YC; Wu, KH; Su, YC; Lee, SC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-九月-2003Device transfer technology by backside etching (DTBE) for poly-Si thin-film transistors on glass/plastic substrateWang, SC; Yeh, CF; Huang, CK; Dai, YT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1997Effect of processing temperature on polysilicon thin-film transistors with liquid-phase deposited oxide as gate insulatorYeh, CF; Chen, TJ; Jeng, JN; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
15-五月-2004Effects of grain boundaries on performance and hot-carrier reliability of excimer-laser annealed polycrystalline silicon thin film transistorsChen, TF; Yeh, CF; Lou, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-十二月-1996Effects of mechanical characteristics on the chemical-mechanical polishing of dielectric thin filmsTseng, WT; Liu, CW; Dai, BT; Yeh, CF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-1997Effects of process temperature on polysilicon thin film transistors with liquid-phase deposited oxides as gate insulatorsYeh, CF; Chen, TJ; Jeng, JN; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Fabricating thin-film transistors on plastic substrates using spin etching and device transferWang, SC; Yeh, CF; Hsu, CT; Lou, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Fabrication of thin-film transistors on plastic substrates by spin etching and device transfer processWang, SC; Hsu, CT; Yeh, CF; Lou, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1998Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT'sYeh, CF; Chen, DC; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2002Highly reliable liquid-phase-deposited SiO2 with nitrous oxide plasma post-treatment for low-temperature-processed polysilicon thin film transistorsYeh, CF; Chen, DCH; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1999Hydrogenation of polysilicon thin-film transistor in a planar inductive H-2/Ar dischargeYeh, CF; Chen, TJ; Liu, C; Gudmundsson, JT; Lieberman, MA; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-五月-2004Impact of air filter material on metal oxide semiconductor (MOS) device characteristics in HF vapor environmentHsiao, CW; Lou, JC; Yeh, CF; Hsieh, CM; Lin, SJ; Kusumi, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002Impact of airborne molecular contamination to nano-device performanceYeh, CF; Hsiao, CW; Lin, SJ; Xie, ZM; Kusumi, T; Aomi, H; Kaneko, H; Da, BT; Tsai, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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