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公開日期標題作者
1-十二月-1993THE EFFECTS OF H-2-O-2-PLASMA TREATMENT ON THE CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; 奈米中心; 次微米人才培訓中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center; CTR SUBMICRON PROFESS TRAINING
1-六月-1989EFFECTS OF HEAT-TREATMENT AND ION DOPING OF INDIUM OXIDELEE, CH; KUO, CV; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
5-七月-1993ELECTRICAL CHARACTERISTICS OF A STACKED NITRIDE MICROCRYSTALLINE-SILICON OXIDE SILICON STRUCTUREWU, SL; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-1995THE ELECTRICAL CHARACTERISTICS OF POLYSILICON OXIDE GROWN IN PURE N2OLAI, CS; LEI, TF; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-1993ELECTRICAL CHARACTERISTICS OF TEXTURED POLYSILICON OXIDE PREPARED BY A LOW-TEMPERATURE WAFER LOADING AND N-2 PREANNEALING PROCESSWU, SL; LIN, TY; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-1990ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMSHO, JH; LEE, CL; LEI, TF; CHAO, TS; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-八月-1990ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMSHO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-九月-1987ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-AHO, JH; LEE, CL; JEN, CW; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-六月-1995ENHANCED H-2-PLASMA EFFECTS ON POLYSILICON THIN-FILM TRANSISTORS WITH THIN ONO GATE-DIELECTRICSYANG, CK; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-1994ENHANCEMENT OF OXIDE BREAK-UP BY IMPLANTATION OF FLUORINE IN POLY-SI EMITTER CONTACTED P-+-N SHALLOW JUNCTION FORMATIONWU, SL; LEE, CL; LEI, TF; CHEN, CF; CHEN, LJ; HO, KZ; LING, YC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-1988ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMSHO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1979EXTENSION OF THE CHARGE CONTROL MODEL FOR BIPOLAR PHOTOTRANSISTORSLEE, CL; FEUCHT, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-1993FAULT ANALYSIS ON (K+1)-VALUED PLA STRUCTURE LOGIC-CIRCUITSWANG, HM; LEE, CL; CHEN, JE; 交大名義發表; 電子物理學系; National Chiao Tung University; Department of Electrophysics
1-三月-1993H-2/O-2 PLASMA ON POLYSILICON THIN-FILM TRANSISTORCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
26-十月-1995HIGH BREAKDOWN VOLTAGE SCHOTTKY-BARRIER DIODE USING P(+)-POLYCRYSTALLINE SILICON DIFFUSED GUARD RINGLIOU, BW; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
25-五月-1995HIGH-BARRIER PT/AL/N-INP DIODEHUANG, WC; LEI, TF; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-1992HIGH-PERFORMANCE POLYSILICON CONTACTED SHALLOW JUNCTIONS FORMED BY STACKED-AMORPHOUS-SILICON FILMSWU, SL; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-1995IDENTIFYING UNTESTABLE FAULTS IN SEQUENTIAL-CIRCUITSLIANG, HC; LEE, CL; CHEN, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-1993THE IMPACT OF TITANIUM SILICIDE ON THE CONTACT RESISTANCE FOR SHALLOW JUNCTION FORMED BY OUT-DIFFUSION OF ARSENIC FROM POLYSILICONYANG, WL; LEI, TF; HUANG, CT; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1994IMPROVED ELECTRICAL CHARACTERISTICS OF THIN-FILM TRANSISTORS FABRICATED ON NITROGEN-IMPLANTED POLYSILICON FILMSYANG, CK; LEI, TF; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics